A method of testing a SIP that has a CPU, a nonvolatile memory and a volatile memory. First, the CPU is used to test the memories. Then the CPU is tested separately. Preferably, the programs for testing the memories are pre-stored in and loaded from the nonvolatile memory into the volatile memory and are executed by the CPU in the volatile memory. Preferably, the test results are stored in the nonvolatile memory.

 
Web www.patentalert.com

< METHOD FOR FORMING POLYCRYSTALLINE THIN FILM BIPOLAR TRANSISTORS

> FLASH MEMORIES WITH ADAPTIVE REFERENCE VOLTAGES

~ 00484