Disclosed is an X-ray diffraction apparatus that irradiates a sample with
X-ray emitted from an X-ray source by resting the X-ray using a
divergence slit and detects diffracted X-ray generated from the sample
using an X-ray detector. The divergence angle of the divergence slit is a
fixed value, and the divergence slit is a slit that restricts the X-ray
irradiation width in the sample width direction. The sample is arranged
in a longitudinally-elongated manner in which its sample width is smaller
than a standard sample width and its sample height is the same as a
standard sample height. X-ray intensity calculated based on an output of
the X-ray detector is compensated based on an effective divergence angle
calculated based on the sample width to thereby obtain true X-ray
intensity.