A method is described for designing a micro electromechanical device in
which the risk of self-actuation of the device in use is reduced. The
method includes locating a first conductor in a plane and locating a
second conductor with its collapsible portion at a predetermined distance
above the plane. The method also includes laterally offsetting the first
conductor by a predetermined distance from a region of maximum actuation
liability. The region of maximum actuation liability is where an
attraction force to be applied to activate the device is at a minimum.