A system for measuring performance of a voltage regulator module (VRM) attached to a microprocessor includes: a voltage transient tester (VTT) fixture (5) for setting different working voltage levels of the VRM; an oscillograph (2) for measuring transient voltage levels of the VRM, and generating a transient voltage waveform according to the transient voltage levels; an voltmeter (3) for measuring steady voltage levels of the VRM under thermal effects generated by the microprocessor; a direct current (DC) electronic load (4) for educing load currents from the VRM; and a measurement control module (10) installed in a computer (1) for generating load current control signals, controlling the DC electronic load to educe the load currents from the VRM according to the load current control signals, and generating a performance report of the VRM by integrating various measurement results.