A test head performs at-speed testing of high serial pin count gigabit per second (GBPS) devices. The test head includes a device under test (DUT) coupled to a first portion of the test head and a rider board coupled to the DUT. The rider board includes a first signal path including switching matrices coupled to the DUT, a second signal path including bit error rate testing (BERT) engines, each of the BERT engines being coupled to each other, corresponding ones of the switching matrices, and to the DUT, and a third signal path including Ethernet testing circuits coupled to the DUT. The BERT engines allow for routing of a test signal from any of the switching matrices to any other switching matrix (e.g., between non-adjacent switching matrices).