A system and method for performing an in-service optical time domain reflectometry (OTDR) and/or insertion loss (IL) measurement(s) using the same wavelength as the data traffic for point-to-point or point-to-multipoint optical fiber networks. The OTDR or IL sessions are multiplexed in accordance with the network protocol in use to avoid any distortion of data transmissions.

 
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< Substrate film thickness measurement method, substrate film thickness measurement apparatus and substrate processing apparatus

> Micro-optical sensor system for pressure, acceleration, and pressure gradient measurements

~ 00464