Programmable memory built-in self-test (MBIST) methods, apparatus, and systems are disclosed. Exemplary embodiments of the disclosed technology can be used, for example, to test one or more memories located on an integrated circuit during manufacturing testing.

 
Web www.patentalert.com

< EL display device, driving method thereof, and electronic equipment provided with the EL display device

> Fuel cell system and related startup method

~ 00461