Disclosed is an internal voltage supplier for the memory device, the internal voltage supplier comprising: a first switching means for selecting one of a first voltage generated from an interior of the memory device and a second voltage applied from an exterior of the memory device; and a divider for receiving the first voltage or the second voltage selected by the first switching means and outputting a plurality of internal voltages.

 
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> Circuit and method for sampling valid command using extended valid address window in double pumped address scheme memory device

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