A memory device capable of detecting its failure, the memory device includes a data input section for receiving data applied from an external part of the memory device; a latch section for receiving and storing therein the data which have passed through the data input section; memory cell arrays for storing therein the data which have passed through the data input section; and a data compressor for determining whether or not the data stored in the latch section and the data stored in the memory cell arrays are identical to each other.

 
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< Information recording and reproducing medium with areas for recording information optically on one side and recording visual information on another side

> Integrated memory having a circuit for testing the operation of the integrated memory, and method for operating the integrated memory

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