A method and system for implementing NAND programming of flash devices during in-circuit testing is described. A flash programmer may receive a program file from an in-circuit tester and device information from a NAND flash device, including information regarding bad cells. The flash programmer converts the program file to account for the bad cells and then programs the NAND flash device with the converted program file. The ability of the flash programmer to translate between the in-circuit tester and a unit under test also allows for more efficient programming of other flash devices.