A modular test controller with a built-in self-test (BIST) circuit for testing an embedded DRAM (eDRAM) circuit is provided. The test controller includes a built-in self-test (BIST) core for performing tests, the BIST core including proven testing algorithms; a selectable tester interface for interfacing the BIST core with an external tester; and a selectable eDRAM interface for interfacing the BIST core with an eDRAM, the eDRAM including a plurality of memory cells for storing data. The present invention allows semiconductor device designers to keep to one testflow and reuse a proven BIST core over multiple ASIC (Application Specific Integrated Circuits) products/generations.