A system includes a process tool for processing a workpiece, a process controller, and a fault monitor. The process controller is configured to determine a control action for updating an operating recipe of the process tool. The fault monitor is configured to determine at least one fault detection threshold based on the control action. A method includes determining a control action for updating an operating recipe of a process tool and determining at least one fault detection threshold based on the control action.

 
Web www.patentalert.com

< Method and apparatus for measuring shape of bumps

> Process for modifying at least one electrical property of a nanotube or a nanowire and a transistor incorporating it

~ 00414