A probe system is provided that includes a linear and/or two-dimensional sensor array for obtaining information regarding a test piece. The sensor elements of the sensor array may include ultrasonic, eddy current, magnetic, and/or piezoelectric elements. The sensor array may be utilized to detect movement of the probe with respect to the test piece, and may be further utilized to obtain data regarding the test piece, such as image data, for example with respect to a characteristic of the test piece in detecting and locating flaws. A CAD type file or other graphical or image file of the test piece may be displayed concurrently with image data of the test piece obtained by the probe for example to assist an operator in navigating the probe with respect to the test piece, and/or to determine a coordinate location of characteristics of the test piece with respect to the CAD type file.