A semiconductor testing system including an input; a display; multiple testing units; a memory in which is stored multiple applications that specify the operating procedure of the testing units and multiple categories that are related to the applications; and a controller that has the function of displaying the categories, displaying on the display the applications relating to the categories selected based on the input from the input, and conducting the applications that have been selected by the input from among the displayed applications and controlling the testing units, and the like.