A measurement apparatus includes a dielectric block, a laser light source
for generating a light beam, an optical system for causing the light beam
to enter the interface between the dielectric block and a metal film at
various incident angles, and a light detection unit for detecting a
parallelized light beam totally reflected at the interface. Properties
are measured while causing a reference molecule, of substantially the
same size and the same refractive index as an analysis object molecule,
to adhere onto the metal film. The reference molecule is removed from the
metal film, and the position of a dark line is measured while the
measurement chip retains a sample. The position of a dark line of the
analysis object molecule is detected by calibrating sensitivity based on
the detection result of the position of the dark line while causing the
reference molecule to adhere onto the metal film.