An integrated memory having a plurality of memory banks includes a test circuit for functional testing of the memory. A plurality of secondary sense amplifiers are assigned to a different one of the memory banks. The test circuit includes a data generator for generating read comparison data. A plurality of comparison circuits are assigned to a different one of the memory banks to compare test data read from the assigned memory bank with the read comparison data. A first input of the respective comparison circuit can be connected to the secondary sense amplifier without interposition of the read/write data lines. A second input can be connected to the read/write data lines to receive the read comparison data supplied by the data generator. An output signal of the respective comparison circuit depends on the comparison result of a data comparison of the first and second inputs.