Disclosed herein are methods and systems for testing the electrical
characteristics of reflective displays, including interferometric
modulator displays. In one embodiment, a controlled voltage is applied to
conductive leads in the display and the resulting current is measured.
The voltage may be controlled so as to ensure that interferometric
modulators do not actuate during the resistance measurements. Also
disclosed are methods for conditioning interferometric modulator display
by applying a voltage waveform that causes actuation of interferometric
modulators in the display.