A device and a method for testing a liquid crystal display panel are disclosed in the present invention, which enable to conveniently inspect a cutting plane of an individual unit liquid crystal panel. The apparatus includes a first memory unit storing a reference image of an end portion of a reference panel taken through a camera, a second memory unit storing an observed image of an end portion of a cut unit liquid crystal display panel taken through the camera, a comparison/computation unit computing a difference value by comparing the reference image and the observed image, and a display unit displaying the difference value of the comparison/computation unit.

 
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> Apparatus and method for measuring alignment accuracy, as well as method and system for manufacturing semiconductor device

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