An external scan test module that is adapted to act as an interface between an automated tester and a device under test. The external scan test module includes a scan pattern memory to hold scan patterns for at least one configuration of the device under test. A failure log memory holds failure information for the device under test. A controller sends scan input data to the device under test, receives scan output data from the device under test, and sends and receives signals from the automated tester. An interface receives scan patterns.