A tamper detection circuit for an integrated circuit includes a pseudo-random generator. A first line is connected to the output of the generator and a second line is connected in parallel via an inverter. A number of XOR gates are coupled to the first and second lines at locations along their length. Output from the XOR gates enables various general operational circuits of the integrated circuit. In the event of one of the lines being cut or otherwise tampered with then the output from the XOR gates will indicate a tamper state. The general operational circuits respond by either resetting or deleting critical data from memory such as the integrated circuit's authentication key. In a preferred version a number of trigger transistors connected to ground are inserted into the paths of the first line and the second line. A physical attack upon the integrated circuit causes a nearby trigger transistor to pull its attached line to ground thereby causing the output of local XOR gates to indicate a tamper state.