A probe card that is manufactured inexpensively. The probe card includes a
base plate, a flexible substrate, and a contact probe. The contact probe
is a flexible substrate formed from polyimide resin. The contact probe
has a plurality of parallel wires. Each wire has a distal end that
functions as a contact. The contact probe is produced by cutting a
general purpose substrate having a plurality of parallel wires formed at
a predetermined pitch. The number of the parallel wires is equal to the
number of pads of an LSI chip.