The present invention provides a testing method for LCD panels. First, a plurality of panels are formed on a substrate. Each panel has first conducting lines and second conducting lines, which are perpendicular to each other. The first conducting lines and the second conducting lines of adjacent panels are electrically connected, respectively. Finally, all panels on the substrate are simultaneously tested by a testing circuit.

 
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> Overlay metrology method and apparatus using more than one grating per measurement direction

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