A method for testing a device-under-test (DUT) includes examining a test
data file that includes test data for testing the structure,
functionality and/or performance of the DUT. The method also includes
separating a first plurality of data units from a second plurality of
data units contained in the test data file. The first plurality of data
units correspond to a first plurality of DUT pins, and the second
plurality of data units correspond to a second plurality of DUT pins.