Systems, methods and apparatus are provided through which a solid-state X-Ray detector is electronically scrubbed and a flat-field X-Ray exposure of the solid-state X-Ray detector is simulated in reference to an adjusted bias of the solid-state X-Ray detector. The simulation yields a gain image of the solid-state X-Ray detector which is in turn suitable for calibrating the solid-state X-Ray detector without projecting an X-Ray beam onto the solid-state X-Ray detector.