The electrically programmable three-dimensional memory (EP-3DM) can be
used to carry the test data and/or test-data seeds for the
circuit-under-test (CUT). When integrated with the CUT, EP-3DM has
minimum impact to the layout of the CUT. Apparently, CUT with integrated
EP-3DM supports IC self-test. Moreover, with a large bandwidth with the
CUT, EP-3DM-based IC self-test enables at-speed test.