A circuit configuration has a load transistor and a current measuring configuration. A method ascertains a load current through a load transistor. The circuit configuration includes a first and a second current sensor with a current measuring transistor in each case. Each of the current sensors provide a current measurement signal that is fed to an evaluation circuit. The evaluation circuit provides, from the first current measurement signal, a current measurement signal that is dependent on the load current. The load transistor and the current measuring transistors are preferably integrated in a common semiconductor body having a multiplicity of transistor cells of identical construction. The evaluation circuit preferably accounts for the spatial position of the cells of the first and second current measuring transistors in the cell array.