The invention relates to an integrated circuit (IC) comprising of a signal transmission channel (TX) including radio frequencies and a built-in tester (TEST) intended to test radio characteristics of said integrated circuit, said tester (TEST) comprising of--first means (COUPL) for recovering a part of the signal generated by the transmission channel (TX) at a first frequency (F0),--second means (M) for converting said recovered signal from the first frequency (F0) into a second frequency (F1),--an amplifier (A) for amplifying said signal at this second frequency (F1), and--a rectifier (R) for rectifying said signal.

 
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