A scanning probe microscope assembly that has an atomic force measurement (AFM) mode, a scanning tunneling measurement (STM) mode, a near-field spectrophotometry mode, a near-field optical mode, and a hardness testing mode for examining an object.

 
Web www.patentalert.com

< Shape memory polymers based on semicrystalline thermoplastic polyurethanes bearing nanostructured hard segments

< Semiconductor nanoparticles, method for producing the same, and fluorescence reagent comprising semiconductor nanoparticles

> Rectifying antenna and method of manufacture

> Mechanical memory
~ 00283