A semiconductor device includes an insulating layer, a conducting portion, and a modified layer. The insulating layer is formed on a semiconductor substrate. The conducting portion is formed in the insulating layer. The modified layer is formed between the insulating layer and the conducting portion. The insulating layer includes hydrogenated polysiloxane. The modified layer is a layer to which the hydrogenated polysiloxane is modified. A portion of the modified layer far from the semiconductor substrate may be thicker than a portion of the modified layer near the semiconductor substrate.

 
Web www.patentalert.com

< Semiconductor device with high structural reliability and low parasitic capacitance

< Method of forming a stacked device filler

> Semiconductor device formed having a metal layer for conducting the device current and for high contrast marking and method thereof

> Bumped chip carrier package using lead frame and method for manufacturing the same

~ 00230