Apparatus and methods for determining thickness and refractive index of thin films and bulk materials are provided. Such apparatus may include a sample support adapted to hold a sample in close contact with the base of a prism, a thermal controller that regulates the temperature of the sample, a light source operable to direct incident light at a variety of incident angles the base of the prism, and a detector positioned to receive output light from the prism. The output light has intensity variations as a function of incident angle. Sample thickness and refractive index may be determined from the intensity variations.

 
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< Heterodyne beam delivery with active control of two orthogonal polarizations

< Device for enabling slow and direct measurement of fluorescence polarization

> Microarray scanning

> Direct method for the correction of pressure induced scrambling of polarized fluorescence intensities

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