A semiconductor circuit designing apparatus includes a circuit design unit executing and an inspection item database section. The circuit design unit executes a logical design of a semiconductor integrated circuit. In the inspection item database section a circuit feature of the semiconductor integrated circuit corresponds to an inspection item of an inspection to be executed before a layout design of the semiconductor integrated circuit is executed. The circuit design unit generates target circuit feature information indicating the circuit feature of a target semiconductor integrated circuit of the semiconductor integrated circuit of which the logical design should be executed. The circuit design unit obtains a target inspection item of the inspection item corresponding to the target circuit feature information from the inspection item database section. The circuit design unit executes the logical design of the target semiconductor integrated circuit in reference to the target inspection item.