An integrated circuit (IC) chip contains a small non-volatile "ID" memory such as an FeRAM array that stores information associated with manufacturing, testing, and performance of the IC chip. The stored information can include but is not limited to a serial number, a wafer ID, a batch ID, a date code, chip history, test data, and performance information. The storing information on the chip eliminates any difficulty in matching the information with the IC chip and provides a flexible permanent record of any information the manufacturer may find useful. The ID memory thus permits tracking and identification of ICs to a degree that was not previously practical. Additionally, a self-test can compare prior test results stored in the ID memory to current self-test results to detect defects or to select operating parameters of the integrated circuit.