A control system architecture that allows a semiconductor laser to be stabilized
with respect to critical parameters, such as output power and/or emission wavelength,
with a reduced cost with respect to the components required to implement control,
while simultaneously maintaining or increasing precision of the control function.
This is achieved using sophisticated integrated circuitry contained within the
laser package to measure data related to multiple laser operation parameters and
to transmit these parameters to a control circuit. In particular, precision thermal
measurements may be used to eliminate the need for optical detectors in the laser
package. The invention described herein has significant utility for different types
of semiconductor lasers, including both edge emitting and VCSEL-type semiconductor lasers.
