A test and measurement instrument acquires a signal from a device under test,
displays
that signal as a source waveform, and makes measurements on that source waveform
with regard to a predetermined property or event. The test and measurement instrument
employs the method of the subject invention for placing these measurements into
a waveform and directly correlating a position in the measurement waveform to the
same area on the source waveform where they were measured. Specifically, the subject
invention displays the correlation of points on a source waveform and a measurement
waveform without requiring the use of a common horizontal time scale. In one embodiment
of the invention, the measurement waveform is a histogram and a pointer to a given
location in the histogram causes identification of corresponding areas in the source waveform.
