Described is an inspection method for detecting defects in dielectic test
materials using a penetrant material and a dielectric sensor. The
penetrant material provides differing dielectric properties from test
material and improves the dielectric contrast between defects
substantially filled by the penetrant and the test material. The penetrant
can be a liquid, such as water, or a powder, as long as it provides a
substantially different complex permittivity than the test material.
