An apparatus for environmental testing of a device under test (DUT), such
as a printed circuit board. The apparatus generally includes a chamber for
environmentally isolating the DUT with the DUT in situ and functional on
another device (e.g., a motherboard). The DUT can be subjected to an
environmental test condition inside the chamber while the other device is
isolated from the environmental test condition. The chamber may have a
connector for coupling the other device and the DUT, such that the DUT and
the other device are in communication although in isolated environments.
