Wafer dicing device and method

   
   

Methods and devices for cutting workpieces, which include a laser adapted to at least partially cut a workpiece, are described. The workpiece is a wafer having a plurality dies each with an integrated circuit. A mechanical cutter follows the laser and engages the workpiece. An embodiment of the mechanical cutter includes a cutting blade adapted to complete a cut through a workpiece. A method includes a two-pass cutting procedure. The first pass is made by a laser, which scribes the workpiece. The second pass is made by the mechanical cutter. In an embodiment, the mechanical cutter follows the scribe created by the laser. In an embodiment, the workpiece is supported by a table. The workpiece moves relative to the laser and the mechanical cutter.

Los métodos y los dispositivos para cortar los objetos, que incluyen un laser adaptado para cortar por lo menos parcialmente un objeto, se describen. El objeto es una oblea que tiene dados cada uno de una pluralidad con un circuito integrado. Un cortador mecánico sigue el laser y contrata el objeto. Una encarnación del cortador mecánico incluye una lámina del corte adaptada para terminar un corte a través de un objeto. Un método incluye un procedimiento two-pass del corte. El primer paso es hecho por un laser, que traza el objeto. El segundo paso es hecho por el cortador mecánico. En una encarnación, el cortador mecánico sigue el escribano creado por el laser. En una encarnación, el objeto es apoyado por una tabla. El objeto se mueve concerniente al laser y al cortador mecánico.

 
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