Gallium nitride-based semiconductor light emitting device

   
   

According to a preferred embodiment of the present invention, there is provided a novel and optimal semiconductor light emitting device comprising a substrate, an n layer disposed co-extensively on the substrate, an n.sub.++ layer disposed non-extensively and flush on one side of the n layer. Furthermore, a p.sup.+ layer is disposed co-extensively on the n.sub.++ layer of the LED according to the invention, with a p layer further disposed co-extensively on the p.sub.+ layer. A p cladding layer is disposed co-extensively on the p layer. A multiple quantum well (MQW) layer is disposed co-extensively on the p cladding layer, and an n cladding layer is further disposed co-extensively on the MQW layer. A second n layer is disposed co-extensively on the n cladding layer. An n.sup.+ layer is disposed co-extensively on the second n layer of the LED according to the invention. After partially etching the device, an n electrode is formed opposite n.sup.++ layer non-extensively on the surface of n layer, and a second n electrode is formed non-extensively (without etching) upon the n.sup.+ layer.

 
Web www.patentalert.com

< Method and apparatus for leak-testing an electroluminescent device

< Electronic device and method of manufacturing the same, and electronic instrument

> Electronic device comprising organic compound having p-type semiconducting characteristics

> Semiconductor device with a semiconductor layer over a surface having a recess pitch no smaller than 0.3 microns

~ 00108