A circuit board tester includes a contact array, contact fingers arranged for travelling in a plane parallel to the contact array, two contact fingers forming a probe pair as a component of a test current circuit, a controller for positioning the contact fingers on circuit board test points of a circuit board to be tested, the circuit boards being insertable into the tester simultaneously during a test procedure being tested, and two sets of contact fingers, one set being arranged for testing the front side and the other set for testing the rear side of a circuit board to be tested. Arranged between the two sets of contact fingers is a holder comprising portions for accommodating at least two circuit b to be tested, at least one of the circuit boards to be tested being insertable in the holder with its front side, and the other circuit board to be tested with its rear side, facing one of the two sets of contact fingers, and the controller is configured such that with both sets of contact fingers the circuit board test points on both the front and rear side of the circuit board to be tested can be contacted during a test procedure.