A matched set of integrated circuit chips (74, 78) and a method for assembling such integrated circuit chips (74, 78) into a matched set are disclosed. A first semiconductor wafer (62) having a plurality of integrated circuit chips (74) of a first type and a second semiconductor wafer (64) having a plurality of integrated circuit chips (78) of a second type are electrically and mechanically coupled to a pair of interposers (52, 53) to form a pair of wafer-interposer assemblies (50, 51). The integrated circuit chips (74, 78) of the first and second wafers (62, 64) are then tested together. The wafer-interposer assemblies (52, 53) are then diced into a plurality of chip assemblies having chips (74) of the first type and a plurality of chip assemblies having chips (78) of the second type. Based upon the testing, at least one of the chip assemblies having chips (74) of the first type and at least one of the chip assemblies having chips (78) of the second type are selected for inclusion in the matched set.